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Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
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Methodology and Test Structures for Studying β-Ga ₂ O ₃ Dielectric and Contact Interfaces

https://doi.org/10.1109/ICMTS63811.2025.11068900

Gruszecki, A A; Roy, J; Agrawal, K S; La_Torraca, P; Cherkaoui, K; Hurley, P K; Wallace, R M; Young, C D (March 2025, IEEE)

Free, publicly-accessible full text available March 24, 2026
Passivation of III–V surfaces with crystalline oxidation

https://doi.org/10.1063/1.5126629

Laukkanen, P.; Punkkinen, M. P.; Kuzmin, M.; Kokko, K.; Lång, J.; Wallace, R. M. (March 2021, Applied Physics Reviews)
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Contact Engineering for Dual-Gate MoS2 Transistors with O2 Plasma Exposure

Bolshakov, P.; Smyth, C. M.; Khosravi, A.; Zhao, P.; Azcatl, A.; Mirabelli, G.; Hurley, P. K.; Hinkle, C. L.; Wallace, R. M.; and Young, C. D. (December 2018, IEEE Semiconductor Interface Specialist Conference (SISC))

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